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Drexel ASIM Lab

Department of Civil, Architectural, and Environmental, Drexel University, 3141 Chestnut Street, Curtis 033, Philadelphia, PA 19104

Drexel Bossone Core Facilities

Bossone Research Enterprise Center, Drexel University, 3140 Market Street, 1st Floor, Philadelphia, PA 19104

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Instruments Available through the Drexel ASIM Lab

Physio-Chemical and Microstructural Characterization Techniques:
- Vapor sorption analyzer (SA Q5000)
- Differential scanning calorimeter (DSC Q20) 
- Thermogravimetric analyzer (TGA Q5000 IR)
- TAM Air isothermal calorimeter 
- Optical microscopes 

Durability and Service-Life Assessment Testing:
- Electrical resistivity measurement
- Electrical impedance spectroscopy
- Chloride profile and corrosion rate
- Half-cell potential
- Chloride migration testing (RCP)
- Freeze-thaw testing (LGCC, ASTM C666, and ASTM C672)
- Alkali silica reaction evaluation (ASTM C227, ASTM C1260, ASTM C1293, and ASTM C1567)
- Carbonation measurement
- Water permeability

Non-Destructive Evaluation Techniques:
- Acoustic emission with waveform analysis
- Electrical sensing
- Pulse velocity
- Resonant frequency
- Impact echo
- Reinforcement location (cover meter)
- ​In‐place strength study (rebound hammer and testing cores)

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Instruments Available through the Drexel Bossone Core Facilities

X-Ray Photoelectron Spectroscopy (XPS) with Auger  
- XPS and AES Spectrometer (Physical Electronics VersaProbe 5000)

Ultrafast Spectroscopy
- Femtosecond Visible Transient Absorption Spectrometer (Ultrafast Systems Helios)
- Time-Resolved Terahertz Spectrometer

Scanning Electron Microscopy
- Scanning Electron Microscope (Zeiss Supra 50VP) with EDS (Oxford)
- Environmental Scanning Electron Microscope (FEI XL30) with EDS (EDAX) and EBSD (TSL)

Transmission Electron Microscopy
- Transmission Electron Microscope (JEOL JEM2100)

Focused Ion Beam
​- Dual Beam Focused Ion Beam - SEM (FEI Strata DB235)

X-Ray Diffraction
- X-Ray Diffractometer (Rigaku SmartLab)
- X-Ray Diffraction Database (JADE 7.0, MDI, Inc)

Small/Wide Angle X-Ray Scattering (SAXS/WAXS)
- Small/Wide Angle X-Ray Scattering (SAXS/WAXS) (Rigaku S-MAX 3000)

Micro Computed Tomography (MicroCT) 
- Micro Computed Tomography System (MicroCT) (Skyscan 1172)

Nano indentation
- Nanoindenter XP with CSM (MTS)

Microfabrication
- ICP Deep Reactive Ion Etching (STS)
- E-beam Evaporator (BOC Edwards A306)
- Thermal Evaporator (Thermionics VE 90)
- Optical Profiler (Zygo NewView 6000)
- Mask Aligner (Karl Zuss MJB-3)
- Laser Ablation System (Resonetics RapidX 250 Workstation)
- Carver Heated Press

​Sample Preparation