Amir Yaghoob Farnam Research Group
Amir Yaghoob Farnam Research Group
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Drexel ASIM Lab

Department of Civil, Architectural, and Environmental, Drexel University, 3141 Chestnut Street, Curtis 033, Philadelphia, PA 19104
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Drexel Bossone Core Facilities

Bossone Research Enterprise Center, Drexel University, 3140 Market Street, 1st Floor, Philadelphia, PA 19104

Instruments Available through the Drexel ASIM Lab

Physio-Chemical and Microstructural Characterization Techniques:
- Vapor sorption analyzer (SA Q5000)
- Differential scanning calorimeter (DSC Q20) 
- Thermogravimetric analyzer (TGA Q5000 IR)
- TAM Air isothermal calorimeter 
- Optical microscopes 

Durability and Service-Life Assessment Testing:
- Electrical resistivity measurement
- Electrical impedance spectroscopy
- Chloride profile and corrosion rate
- Half-cell potential
- Chloride migration testing (RCP)
- Freeze-thaw testing (LGCC, ASTM C666, and ASTM C672)
- Alkali silica reaction evaluation (ASTM C227, ASTM C1260, ASTM C1293, and ASTM C1567)
- Carbonation measurement
- Water permeability

Non-Destructive Evaluation Techniques:
- Acoustic emission with waveform analysis
- Electrical sensing
- Pulse velocity
- Resonant frequency
- Impact echo
- Reinforcement location (cover meter)
- ​In‐place strength study (rebound hammer and testing cores)

Instruments Available through the Drexel Bossone Core Facilities

X-Ray Photoelectron Spectroscopy (XPS) with Auger  
- XPS and AES Spectrometer (Physical Electronics VersaProbe 5000)

Ultrafast Spectroscopy
- Femtosecond Visible Transient Absorption Spectrometer (Ultrafast Systems Helios)
- Time-Resolved Terahertz Spectrometer

Scanning Electron Microscopy
- Scanning Electron Microscope (Zeiss Supra 50VP) with EDS (Oxford)
- Environmental Scanning Electron Microscope (FEI XL30) with EDS (EDAX) and EBSD (TSL)

Transmission Electron Microscopy
- Transmission Electron Microscope (JEOL JEM2100)

Focused Ion Beam
​- Dual Beam Focused Ion Beam - SEM (FEI Strata DB235)

X-Ray Diffraction
- X-Ray Diffractometer (Rigaku SmartLab)
- X-Ray Diffraction Database (JADE 7.0, MDI, Inc)

Small/Wide Angle X-Ray Scattering (SAXS/WAXS)
- Small/Wide Angle X-Ray Scattering (SAXS/WAXS) (Rigaku S-MAX 3000)

Micro Computed Tomography (MicroCT) 
- Micro Computed Tomography System (MicroCT) (Skyscan 1172)

Nano indentation
- Nanoindenter XP with CSM (MTS)

Microfabrication
- ICP Deep Reactive Ion Etching (STS)
- E-beam Evaporator (BOC Edwards A306)
- Thermal Evaporator (Thermionics VE 90)
- Optical Profiler (Zygo NewView 6000)
- Mask Aligner (Karl Zuss MJB-3)
- Laser Ablation System (Resonetics RapidX 250 Workstation)
- Carver Heated Press

​Sample Preparation
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